Fast Test Integration: Toward Plug-and-Play At-Speed Testing of Multiple Clock Domains Based on IEEE Standard 1500
Po-Lin Chen, Yu-Chieh Huang, Tsin-Yuan ChangVolume:
29
Year:
2010
Language:
english
DOI:
10.1109/tcad.2010.2055010
File:
PDF, 507 KB
english, 2010