Low Cost EVM Testing of Wireless RF SoC Front-Ends Using...

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems 2012 Vol. 31; Iss. 7

Low Cost EVM Testing of Wireless RF SoC Front-Ends Using Multitones

Natarajan, V., Hyun Woo Choi, Banerjee, A., Sen, S., Chatterjee, A., Srinivasan, G., Taenzler, F., Bhattacharya, S.
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Volume:
31
Year:
2012
Language:
english
DOI:
10.1109/tcad.2012.2187652
File:
PDF, 12.31 MB
english, 2012
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