A new post-viterbi processor based on soft-reliability...

IEEE Transactions on Consumer Electronics 2011 Vol. 57; Iss. 2

A new post-viterbi processor based on soft-reliability information

Jun Lee, Schouhamer Immink, K.A.
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Volume:
57
Year:
2011
Language:
english
DOI:
10.1109/tce.2011.5955231
File:
PDF, 423 KB
english, 2011
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