Relationship of X/R, IP, and IRMS' to Asymmetry in...

IEEE Transactions on Industry Applications 1985 Vol. IA-21; Iss. 2

Relationship of X/R, IP, and IRMS' to Asymmetry in Resistance/Reactance Circuits

Reichenstein, Hermann W., Gomez, Juan C.
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Volume:
IA-21
Year:
1985
Language:
english
DOI:
10.1109/tia.1985.349691
File:
PDF, 2.91 MB
english, 1985
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