Analyzing reliability - a simple yet rigorous approach

Analyzing reliability - a simple yet rigorous approach

Bono, R., Alexander, R., Dorman, A., Yong-Jin Kim, Reisdorf, J.
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Volume:
40
Year:
2004
Language:
english
DOI:
10.1109/tia.2004.831295
File:
PDF, 370 KB
english, 2004
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