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Modeling of MOS-Side Carrier Injection in Trench-Gate IGBTs
Liqing Lu, Zhiyang Chen, Bryant, A., Hudgins, J.L., Palmer, P.R., Santi, E.Volume:
46
Year:
2010
Language:
english
DOI:
10.1109/tia.2009.2039770
File:
PDF, 734 KB
english, 2010