High-Speed Embedded-Object Analysis Using a Dual-Line...

IEEE Transactions on Industrial Electronics 2011 Vol. 58; Iss. 3

High-Speed Embedded-Object Analysis Using a Dual-Line Timed-Address-Event Temporal-Contrast Vision Sensor

Belbachir, A.N., Hofstätter, M., Litzenberger, M., Schön, P.
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Volume:
58
Year:
2011
Language:
english
DOI:
10.1109/tie.2010.2095390
File:
PDF, 1.43 MB
english, 2011
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