Fault-tolerant memory organization: Impact on chip yield...

IEEE Transactions on Magnetics 1974 Vol. 10; Iss. 3

Fault-tolerant memory organization: Impact on chip yield and system cost

Naden, R., West, F.
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Volume:
10
Year:
1974
Language:
english
DOI:
10.1109/tmag.1974.1058498
File:
PDF, 386 KB
english, 1974
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