Status of Lumped Elements in Microwave Integrated Circuits---Present and Future
Caulton, M., Hershenov, B., Knight, S.P., DeBrecht, R.E.Volume:
19
Year:
1971
Language:
english
DOI:
10.1109/tmtt.1971.1127586
File:
PDF, 2.38 MB
english, 1971