Device Characterization for Computer Analysis of Large...

IEEE Transactions on Nuclear Science 1971 Vol. 18; Iss. 6

Device Characterization for Computer Analysis of Large Circuits

Lindholm, Fredrik A.
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Volume:
18
Year:
1971
Language:
english
DOI:
10.1109/tns.1971.4326434
File:
PDF, 895 KB
english, 1971
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