Role Transport and Charge Relaxation in Irradiated SiO2 MOS...

Role Transport and Charge Relaxation in Irradiated SiO2 MOS Capacitors

Boesch, H. E., McLean, F. B., McGarrity, J. M., Ausman, G. A.

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Volume:

Year:

1975

Language:

english

DOI:

10.1109/tns.1975.4328098

File:

PDF, 1.06 MB

english, 1975

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