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Role Transport and Charge Relaxation in Irradiated SiO2 MOS Capacitors
Boesch, H. E., McLean, F. B., McGarrity, J. M., Ausman, G. A.Volume:
22
Year:
1975
Language:
english
DOI:
10.1109/tns.1975.4328098
File:
PDF, 1.06 MB
english, 1975