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Investigation of Radiation Effects and Hardening Procedures for CMOS/SOS
Peel, J. L., Pancholy, R. K., Kuhlmann, G. J., Oki, T. J., Williams, R. A.Volume:
22
Year:
1975
Language:
english
DOI:
10.1109/tns.1975.4328102
File:
PDF, 933 KB
english, 1975