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Device Degradation by High Amplitude Currents and Response Characteristics of Discrete Resistors
Tasca, D. M., Wunsch, D. C., Domingos, H.Volume:
22
Year:
1975
Language:
english
DOI:
10.1109/tns.1975.4328161
File:
PDF, 1.29 MB
english, 1975