Device Degradation by High Amplitude Currents and Response...

Device Degradation by High Amplitude Currents and Response Characteristics of Discrete Resistors

Tasca, D. M., Wunsch, D. C., Domingos, H.

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Volume:

Year:

1975

Language:

english

DOI:

10.1109/tns.1975.4328161

File:

PDF, 1.29 MB

english, 1975

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