A Pattern Recognition Technique for System Error Analysis

IEEE Transactions on Reliability 1971 Vol. R-20; Iss. 3

A Pattern Recognition Technique for System Error Analysis

Hankley, William J., Merrill, Hyde M.
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Volume:
R-20
Year:
1971
Language:
english
DOI:
10.1109/tr.1971.5216117
File:
PDF, 949 KB
english, 1971
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