Reliability Analysis of Multistate Device Networks

IEEE Transactions on Reliability 1978 Vol. R-27; Iss. 3

Reliability Analysis of Multistate Device Networks

Gopal, Krishna, Aggarwal, K. K., Gupta, J. S.
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Volume:
R-27
Year:
1978
Language:
english
DOI:
10.1109/tr.1978.5220338
File:
PDF, 661 KB
english, 1978
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