Improved Characterization Methodology of Gate-Bulk Leakage...

Improved Characterization Methodology of Gate-Bulk Leakage and Capacitance for Ultrathin Oxide Partially Depleted SOI Floating-Body CMOS

Chen, D.C., Lee, R., Yuan-Chang Liu, Guan-Shyan Lin, Mao-Chyuan Tang, Meng-Fan Wang, Chune-Sin Yeh, Shan-Chieh Chien
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Volume:
25
Year:
2012
Language:
english
DOI:
10.1109/tsm.2011.2181668
File:
PDF, 8.24 MB
english, 2012
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