Direct observation of the electrical activity of coincidence-site lattice boundaries in location-controlled silicon islands using scanning spread resistance microscopy
Nobuyuki Matsuki, Ryoichi Ishihara, Kees BeenakkerVolume:
17
Year:
2009
Language:
english
DOI:
10.1889/jsid17.3.293
File:
PDF, 1.09 MB
english, 2009