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Technical Note: Detection and Adjustment of Abnormal Test-Day Yields
G.R. Wiggans, P.M. VanRaden, J.C. PhilpotVolume:
86
Year:
2003
Language:
english
DOI:
10.3168/jds.s0022-0302(03)73868-5
File:
PDF, 250 KB
english, 2003