Correlation between structure and optoelectronic properties...

Correlation between structure and optoelectronic properties of undoped microcrystalline silicon

Frank Siebke, Shigeo Yata, Yoshihiro Hishikawa, Makoto Tanaka
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Volume:
227-230
Year:
1998
Language:
english
DOI:
10.1016/s0022-3093(98)00261-0
File:
PDF, 112 KB
english, 1998
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