Elemental trace analysis of small samples by proton induced...

Analytical Chemistry 1975 / 05 Vol. 47; Iss. 6

Elemental trace analysis of small samples by proton induced x-ray emission

Johansson, Thomas B., Van Grieken, Rene E., Nelson, J. William., Winchester, John W.
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Volume:
47
Language:
english
Journal:
Analytical Chemistry
DOI:
10.1021/ac60356a035
Date:
May, 1975
File:
PDF, 775 KB
english, 1975
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