[IEEE 2012 IEEE 15th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS) - Tallinn, Estonia (2012.04.18-2012.04.20)] 2012 IEEE 15th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS) - LC-VCO design automation tool for nanometer CMOS technology
Siwiec, Krzysztof, Borejko, Tomasz, Pleskacz, Witold A.Year:
2012
Language:
english
DOI:
10.1109/ddecs.2012.6219027
File:
PDF, 987 KB
english, 2012