Ins and outs of digital electron microscopy
Koeck, Philip J.B.Volume:
49
Language:
english
Pages:
7
Journal:
Microscopy Research and Technique
DOI:
10.1002/(sici)1097-0029(20000501)49:33.0.co;2-3
Date:
May, 2000
File:
PDF, 97 KB
english, 2000