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[IEEE 2010 IEEE Bipolar/BiCMOS Circuits and Technology Meeting - BCTM - Austin, TX, USA (2010.10.4-2010.10.6)] 2010 IEEE Bipolar/BiCMOS Circuits and Technology Meeting (BCTM) - Base resistance distribution in bipolar transistors: Relevance to compact noise modeling and extraction from admittance parameters
Vitale, Francesco, Pijper, Ralf, van der Toorn, RamsesYear:
2010
Language:
english
DOI:
10.1109/bipol.2010.5667931
File:
PDF, 452 KB
english, 2010