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[IEEE International Conference on Advanced Semiconductor Devices and Microsystems (ASDAM) - Smolenice, Slovakia (16-18 Oct. 2000)] ASDAM 2000. Conference Proceedings. Third International EuroConference on Advanced Semiconductor Devices and Microsystems (Cat. No.00EX386) - The influence of defect diffusion under electric field on optical and luminescent characteristics of cadmium sulphide
Borkovskaya, L.V., Dzhumaev, B.R., Khomenkova, L.Yu., Korsunskaya, N.E., Markevich, I.V.Year:
2000
Language:
english
DOI:
10.1109/asdam.2000.889478
File:
PDF, 293 KB
english, 2000