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[IEEE International Test Conference 2004 - Charlotte, NC, USA (26-28 Oct. 2004)] 2004 International Conferce on Test - An SRAM weak cell fault model and a DFT technique with a programmable detection threshold
Pavlov, A., Sachdev, M., Pineda de Gyvez, J.Year:
2004
Language:
english
DOI:
10.1109/test.2004.1387366
File:
PDF, 692 KB
english, 2004