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SPIE Proceedings [SPIE Nondestructive Evaluation Techniques for Aging Infrastructure and Manufacturing - Scottsdale, AZ (Tuesday 3 December 1996)] Nondestructive Evaluation for Process Control in Manufacturing - Measurement of thickness and elastic properties of electroactive polymer films using plate wave dispersion data
Bar-Cohen, Yoseph, Lih, Shyh-Shiuh, El-Azab, Anter, Mal, Ajit K., Bossi, Richard H., Moran, TomVolume:
2948
Year:
1996
Language:
english
DOI:
10.1117/12.259187
File:
PDF, 205 KB
english, 1996