In situ Real-Time X-ray Reciprocal Space...

Applied Physics Express 2009 / 7 Vol. 2

In situ Real-Time X-ray Reciprocal Space Mapping during InGaAs/GaAs Growth for Understanding Strain Relaxation Mechanisms

Sasaki, Takuo, Suzuki, Hidetoshi, Sai, Akihisa, Lee, Jong-Han, Takahasi, Masamitu, Fujikawa, Seiji, Arafune, Koji, Kamiya, Itaru, Ohshita, Yoshio, Yamaguchi, Masafumi
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Volume:
2
Language:
english
Journal:
Applied Physics Express
DOI:
10.1143/apex.2.085501
Date:
July, 2009
File:
PDF, 635 KB
english, 2009
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