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[IEEE 2009 IEEE International Vacuum Electronics Conference (IVEC) - Rome, Italy (2009.04.28-2009.04.30)] 2009 IEEE International Vacuum Electronics Conference - Experimental, numerical and analytical studies of the staggered double vane structure for THz application

Young-Min Shin,, Barnett, Larry R., Luhmann, Neville C.
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Year:
2009
Language:
english
DOI:
10.1109/ivelec.2009.5193375
File:
PDF, 653 KB
english, 2009
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