[IEEE 2009 IEEE International Vacuum Electronics Conference (IVEC) - Rome, Italy (2009.04.28-2009.04.30)] 2009 IEEE International Vacuum Electronics Conference - Experimental, numerical and analytical studies of the staggered double vane structure for THz application
Young-Min Shin,, Barnett, Larry R., Luhmann, Neville C.Year:
2009
Language:
english
DOI:
10.1109/ivelec.2009.5193375
File:
PDF, 653 KB
english, 2009