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Spatial distribution of defects in high‐purity silica glasses
Tohmon, Ryoichi, Ikeda, Akihiro, Shimogaichi, Yasushi, Munekuni, Shuji, Ohki, Yoshimichi, Nagasawa, Kaya, Hama, YoshimasaVolume:
67
Year:
1990
Language:
english
DOI:
10.1063/1.345681
File:
PDF, 624 KB
english, 1990