[IEEE Tutorial (ICICDT) - Grenoble, France (2008.06.2-2008.06.4)] 2008 IEEE International Conference on Integrated Circuit Design and Technology and Tutorial - Temperature-based phase change memory model for pulsing scheme assessment
Yi-Bo Liao,, Jun-Tin Lin,, Meng-Hsueh Chiang,Year:
2008
Language:
english
DOI:
10.1109/icicdt.2008.4567278
File:
PDF, 695 KB
english, 2008