[IEEE 32nd European Solid-State Device Research Conference...

  • Main
  • [IEEE 32nd European Solid-State Device...

[IEEE 32nd European Solid-State Device Research Conference - Firenze, Italy (2002.9.24-2002.9.26)] 32nd European Solid-State Device Research Conference - Impact of Source/drain Implants on Threshold Voltage Matching in Deep Sub-micron CMOS Technologies

Dubois, J., Knol, J., Bolt, M., Tuinhout, H., Schmitz, J., Stolk, P.
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Year:
2002
Language:
english
DOI:
10.1109/essderc.2002.194883
File:
PDF, 145 KB
english, 2002
Conversion to is in progress
Conversion to is failed