Deep-ultraviolet Raman investigation of silicon oxide: thin...

Advances in Natural Sciences: Nanoscience and Nanotechnology 2012 / 09 Vol. 3; Iss. 4

Deep-ultraviolet Raman investigation of silicon oxide: thin film on silicon substrate versus bulk material

Borowicz, Paweł, Latek, Mariusz, Rzodkiewicz, Witold, Łaszcz, Adam, Czerwinski, Andrzej, Ratajczak, Jacek
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Volume:
3
Language:
english
Journal:
Advances in Natural Sciences: Nanoscience and Nanotechnology
DOI:
10.1088/2043-6262/4/045003
Date:
September, 2012
File:
PDF, 1.12 MB
english, 2012
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