[IEEE ICMTS 2001. Proceedings of the 2001 International...

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[IEEE ICMTS 2001. Proceedings of the 2001 International Conference on Microelectronic Test Structures - Kobe, Japan (19-22 March 2001)] ICMTS 2001. Proceedings of the 2001 International Conference on Microelectronic Test Structures (Cat. No.01CH37153) - Modeling of non-linear polysilicon resistors for analog circuit design

Virkus, R., Weiser, D., Green, K., Richardson, D., Westphal, G.
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Year:
2001
Language:
english
DOI:
10.1109/icmts.2001.928643
File:
PDF, 236 KB
english, 2001
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