A Low Overhead High Test Compression Technique Using...

A Low Overhead High Test Compression Technique Using Pattern Clustering With $n$-Detection Test Support

Seongmoon Wang, Wenlong Wei, Zhanglei Wang
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Volume:
18
Year:
2010
Language:
english
DOI:
10.1109/tvlsi.2009.2026420
File:
PDF, 809 KB
english, 2010
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