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[IEEE 1995 IEEE MTT-S International Microwave Symposium - Orlando, FL, USA (16-20 May 1995)] Proceedings of 1995 IEEE MTT-S International Microwave Symposium - Simulation of temperature dependencies using a new and CAD suitable physical GaAs-MESFET model including the electron preheating effect
Nevermann, P., Wolff, I.Year:
1995
Language:
english
DOI:
10.1109/mwsym.1995.405896
File:
PDF, 441 KB
english, 1995