[IEEE IVESC 2004. The 5th International Vacuum Electron Sources - Beijing, China (6-10 Sept. 2004)] IVESC 2004. The 5th International Vacuum Electron Sources Conference Proceedings (IEEE Cat. No.04EX839) - The study of traveling-wave tube cold-test characteristics by three-dimensional simulation code
Zhaojun Zhu,, Baofu Jia,, Zhengxiang Luo,Year:
2004
Language:
english
DOI:
10.1109/ivesc.2004.1414266
File:
PDF, 148 KB
english, 2004