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[IEEE 2006 International Biennial Baltic Electronics Conference - Tallinn, Estonia (2006.10.2-2006.10.4)] 2006 International Biennial Baltic Electronics Conference - Distributed Genetic Algorithm of Test Generation For Digital Circuits

Skobtsov, Y.A., El-Khatib, A.i., Ivanov, D.E.
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Year:
2006
Language:
english
DOI:
10.1109/bec.2006.311096
File:
PDF, 4.32 MB
english, 2006
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