[IEEE 2004 International Symposium on Electromagnetic Compatibility - Silicon Valley, CA, USA (9-13 Aug. 2004)] 2004 International Symposium on Electromagnetic Compatibility (IEEE Cat. No.04CH37559) - Comparison of via equivalent circuit model accuracy using quasi-static and full-wave approaches
Archambeault, B., Connor, S., Jianmin Zhang,, Drewniak, J., Lai, M., Orlandi, A., Antonini, G., Ruehli, A.Year:
2004
Language:
english
DOI:
10.1109/isemc.2004.1349962
File:
PDF, 295 KB
english, 2004