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[IEEE Exposition: Latin America - Sao Paulo, Brazil (2010.11.8-2010.11.10)] 2010 IEEE/PES Transmission and Distribution Conference and Exposition: Latin America (T&D-LA) - Distribution reliability evaluation affected by superconducting fault current limiter

Kim, Sung-Yul, Kim, Jin-O, Bae, In-Su, Cha, Jun-Min
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Year:
2010
Language:
english
DOI:
10.1109/tdc-la.2010.5762912
File:
PDF, 814 KB
english, 2010
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