Composition and lattice‐mismatch measurement of thin...

Composition and lattice‐mismatch measurement of thin semiconductor layers by x‐ray diffraction

Fewster, P. F., Curling, C. J.
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Volume:
62
Year:
1987
Language:
english
DOI:
10.1063/1.339133
File:
PDF, 599 KB
english, 1987
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