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[IEEE Design, Automation and Test in Europe - Munich, Germany (07-11 March 2005)] Design, Automation and Test in Europe - Soft-Error Tolerance Analysis and Optimization of Nanometer Circuits
Dhillon, Y.S., Diril, A.U., Chatterjee, A.Year:
2005
Language:
english
DOI:
10.1109/date.2005.274
File:
PDF, 202 KB
english, 2005