[IEEE 2011 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) - Vancouver, BC, Canada (2011.10.3-2011.10.5)] 2011 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems - CNT-count Failure Characteristics of Carbon Nanotube FETs under Process Variations
Ghavami, Behnam, Raji, Mohsen, Pedram, Hossein, Arjmand, Omid NaghshinehYear:
2011
Language:
english
DOI:
10.1109/dft.2011.31
File:
PDF, 1.10 MB
english, 2011