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[IEEE 2010 19th Asian Test Symposium (ATS) - Shanghai, China (2010.12.1-2010.12.4)] 2010 19th IEEE Asian Test Symposium - Efficient Simulation of Structural Faults for the Reliability Evaluation at System-Level
Kochte, Michael A., Zoellin, Christian G., Baranowski, Rafal, Imhof, Michael E., Wunderlich, Hans-Joachim, Hatami, Nadereh, Carlo, Stefano Di, Prinetto, PaoloYear:
2010
Language:
english
DOI:
10.1109/ats.2010.10
File:
PDF, 307 KB
english, 2010