Study of the local electrical properties of metal surfaces...

IEEE Transactions on Components Packaging and Manufacturing Technology Part A 1998 Vol. 21; Iss. 1

Study of the local electrical properties of metal surfaces using an AFM with a conducting probe

Schneegans, O., Houze, F., Meyer, R., Boyer, L.
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Volume:
21
Year:
1998
Language:
english
DOI:
10.1109/95.679036
File:
PDF, 179 KB
english, 1998
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