Effects of Moisture and Hydrogen Exposure on Radiation-Induced MOS Device Degradation and Its Implications for Long-Term Aging
Schwank, James R., Shaneyfelt, Marty R., Dasgupta, Aritra, Francis, S. A., Zhou, Xing J., Fleetwood, Daniel M., Schrimpf, Ronald D., Pantelides, Sokrates T., Felix, James A., Dodd, Paul E., Ferlet-CavVolume:
55
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/tns.2008.2005676
Date:
December, 2008
File:
PDF, 886 KB
english, 2008