Radiation damage in scientific charge-coupled devices

IEEE Transactions on Nuclear Science 1989 / Feb. Vol. 36; Iss. 1

Radiation damage in scientific charge-coupled devices

Janesick, J., Elliott, T., Pool, F.
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Volume:
36
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/23.34503
Date:
January, 1989
File:
PDF, 767 KB
english, 1989
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