[IEEE 2003 IEEE Nuclear Science Symposium. Conference Record (IEEE Cat. No.03CH37515) - Portland, OR, USA (2003.10.25-2003.10.25)] 2003 IEEE Nuclear Science Symposium. Conference Record (IEEE Cat. No.03CH37515) - Investigation of radiation damage in the SLD CCD vertex detector 2003 IEEE nuclear science symposium, medical imaging conference, and workshop of room-temperature semiconductor detectors
Brau, J.E., Igonkina, O.B., Potter, C.T., Sinev, N.B.Year:
2003
Language:
english
DOI:
10.1109/nssmic.2003.1351871
File:
PDF, 333 KB
english, 2003