Dose Rate and Static/Dynamic Bias Effects on CCDs Degradation
Martin, Emma, Nuns, Thierry, David, Jean-Pierre, Gilard, Olivier, Boutillier, Mathieu, Penquer, AntoineVolume:
58
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/tns.2011.2132739
Date:
June, 2011
File:
PDF, 966 KB
english, 2011