[IEEE TENCON 2007 - 2007 IEEE Region 10 Conference -...

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[IEEE TENCON 2007 - 2007 IEEE Region 10 Conference - Taipei, Taiwan (2007.10.30-2007.11.2)] TENCON 2007 - 2007 IEEE Region 10 Conference - A study on the thermal reliability of high voltage MOSFET device

Hyun-Duck Lee,, Seung-Bum Yuk,, Jae-Hyeon Lee,, Jae-Chang Kwak,, Kui-Dong Kim,, Yong-Seo Koo,
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Year:
2007
Language:
english
DOI:
10.1109/tencon.2007.4429013
File:
PDF, 1.08 MB
english, 2007
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