[IEEE IECON 2009 - 35th Annual Conference of IEEE...

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[IEEE IECON 2009 - 35th Annual Conference of IEEE Industrial Electronics (IECON) - Porto, Portugal (2009.11.3-2009.11.5)] 2009 35th Annual Conference of IEEE Industrial Electronics - Structural health monitoring: Subsurface defects detection

Leong, Wai Yie, Wei, Liu
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Year:
2009
Language:
english
DOI:
10.1109/iecon.2009.5414919
File:
PDF, 569 KB
english, 2009
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